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タイトル
  • en Dissociative reactions induced by electron impact and electron transport in TEOS vapor
作成者
    • ja 川口, 悟 en KAWAGUCHI, Satoru ja-Kana カワグチ, サトル
    • en HIGUCHI, Hisashi
    • en LI, Hu
    • en TAKAHASHI, Kazuhiro ja 髙橋, 一弘 ja-Kana タカハシ, カズヒロ
    • ja 佐藤, 孝紀 ja-Kana サトウ, コウキ en SATOH, Kohki
アクセス権 open access
権利情報
  • en © 2019 Japan Society of Applied Physics
主題
  • NDC 427
内容注記
  • Other application/pdf
  • Abstract en Reactions for dissociative ionization and neutral dissociation collisions between an electron and a tetraethoxysilane [Si(OC2H5)4, TEOS] molecule are reported, and neutral dissociation cross sections are calculated by applying the classical Rice–Ramsperger–Kassel theory. Detailed electron collision cross section set of TEOS vapor, including 18 neutral dissociation cross sections and 20 ionization cross sections, is constructed. Electron transport coefficients, such as the mean-arrival-time drift velocity, bulk drift velocity, longitudinal bulk diffusion coefficient, and ionization coefficient, and rate coefficients for both elastic and inelastic collisions in TEOS vapor are calculated from the present cross section set using a Monte Carlo method. The validity of the present cross section set is demonstrated by comparing the calculated electron transport coefficients with measured data. Furthermore, fragmentation of TEOS molecules by electron impact is simulated, and then the number of fragments produced in the simulation is compared with the measured mass spectra.
出版者 en Japan Society of Applied Physics
日付
    Issued2019-06-05
言語
  • eng
資源タイプ journal article
出版タイプ AM
資源識別子 HDL http://hdl.handle.net/10258/00009977 , URI https://muroran-it.repo.nii.ac.jp/records/10029
関連
  • isVersionOf DOI https://doi.org/10.7567/1347-4065/ab215c
収録誌情報
    • PISSN 0021-4922
    • NCID AA12295836
      • en Japanese Journal of Applied Physics
      • 58 6 開始ページ066003
ファイル
コンテンツ更新日時 2023-11-10