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Probing subpicosecond dynamics using pulsed laser combined scanning tunneling microscopy
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| 権利情報 |
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Copyright 2004 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Appl. Phys. Lett. 85, 3268 (2004) and may be found at https://dx.doi.org/10.1063/1.1804238
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| 内容注記 |
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Time-resolved tunneling current measurement in the subpicosecond range was realized by ultrashort-pulse laser combined scanning tunneling microscopy, using the shaken-pulse-pair method. A low-temperature-grown GaN_[x]As_[1-x] (x=0.36%) sample exhibited two ultrafast transient processes in the time-resolved tunnel current signal, whose lifetimes were determined to be 0.653±0.025 and 55.1±5.0 ps. These values are of the same order of magnitude as those measured in the conventional pump-probe reflectivity measurement.
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| 出版者 | American Institute of Physics
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| 日付 | Issued 2004-10-11
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| 言語 | eng |
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| 資源タイプ | journal article |
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| 出版タイプ | VoR |
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| 資源識別子 | URI http://hdl.handle.net/2115/45341
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DOI
https://doi.org/10.1063/1.1804238
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| コンテンツ更新日時 | 2019-05-29T08:10:42Z |
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