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タイトル
  • Probing subpicosecond dynamics using pulsed laser combined scanning tunneling microscopy
作成者

Takeuchi, Osamu

Aoyama, Masahiro

Oshima, Ryuji

Okada, Yoshitaka

Oigawa, Haruhiro

Sano, Nobuyuki

Shigekawa, Hidemi

Morita, Ryuji

Yamashita, Mikio

権利情報
    • Copyright 2004 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Appl. Phys. Lett. 85, 3268 (2004) and may be found at https://dx.doi.org/10.1063/1.1804238
主題
  • NDC 549
内容注記
Other
  • Time-resolved tunneling current measurement in the subpicosecond range was realized by ultrashort-pulse laser combined scanning tunneling microscopy, using the shaken-pulse-pair method. A low-temperature-grown GaN_[x]As_[1-x] (x=0.36%) sample exhibited two ultrafast transient processes in the time-resolved tunnel current signal, whose lifetimes were determined to be 0.653±0.025 and 55.1±5.0 ps. These values are of the same order of magnitude as those measured in the conventional pump-probe reflectivity measurement.
出版者American Institute of Physics
日付 Issued 2004-10-11
言語eng
資源タイプjournal article
出版タイプVoR
資源識別子 URI http://hdl.handle.net/2115/45341
関連
  • isIdenticalTo DOI https://doi.org/10.1063/1.1804238
収録誌情報
    • ISSN 0003-6951
    • ISSN 1077-3118
    • Applied Physics Letters
    85(15), 3268-3270
ファイル
コンテンツ更新日時2019-05-29T08:10:42Z