An approach to nano-chemical analysis through NC-AFM technique

Suzuki S.; Koike Y.; Fujikawa K.; Matsudaira N.; Nakamura M.; Chun W.-J.; Nomura M.; Asakura K.

Title	en An approach to nano-chemical analysis through NC-AFM technique
Creator	en Suzuki, S. en Koike, Y. en Fujikawa, K. en Matsudaira, N. en Nakamura, M. en Chun, W.-J. en Nomura, M. en Asakura, K. NRID 1000060175164
Accessrights	open access
Subject	Other en XANAM Other en NC-AFM Other en Oxide surface NDC 428
Description	Abstract en We have measured the NC-AFM frequency shift dependence on the X-ray energy around the Au L3 absorption edge energy. We found a peak in the frequency shift just above the Au region at the Au L3 absorption edge energy while we could not detect any peak in the frequency shift when the NC-AFM tip was placed above the Si regions. This novel phenomenon indicated that the combination of energy-variable X-rays and NC-AFM provides us a new way to nano level chemical mapping at surface. We briefly discussed some possible mechanisms.
Publisher	en Elsevier B.V.
Date	Issued2006-09-30
Language	eng
Resource Type	journal article
Version Type	AM
Identifier	HDL http://hdl.handle.net/2115/15417
Relation	URI http://www.sciencedirect.com/science/journal/09205861 isVersionOf DOI https://doi.org/10.1016/j.cattod.2006.05.008
Journal	PISSN 0920-5861 en Catalysis Today Volume Number117 Issue Number1-3 Page Start80 Page End83
File	fulltext 5WCOC_OA105szk_hokudai_revBW.pdf 701.09 KB (application/pdf) Issued2006-09-30
Oaidate	2023-07-26