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Title
  • en Probing subpicosecond dynamics using pulsed laser combined scanning tunneling microscopy
Creator
    • en Takeuchi, Osamu
    • en Aoyama, Masahiro
    • en Oshima, Ryuji
    • en Okada, Yoshitaka
    • en Oigawa, Haruhiro
    • en Sano, Nobuyuki
    • en Shigekawa, Hidemi
Accessrights open access
Rights
  • en Copyright 2004 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Appl. Phys. Lett. 85, 3268 (2004) and may be found at https://dx.doi.org/10.1063/1.1804238
Subject
  • NDC 549
Description
  • Abstract en Time-resolved tunneling current measurement in the subpicosecond range was realized by ultrashort-pulse laser combined scanning tunneling microscopy, using the shaken-pulse-pair method. A low-temperature-grown GaN_[x]As_[1-x] (x=0.36%) sample exhibited two ultrafast transient processes in the time-resolved tunnel current signal, whose lifetimes were determined to be 0.653±0.025 and 55.1±5.0 ps. These values are of the same order of magnitude as those measured in the conventional pump-probe reflectivity measurement.
Publisher en American Institute of Physics
Date
    Issued2004-10-11
Language
  • eng
Resource Type journal article
Version Type VoR
Identifier HDL http://hdl.handle.net/2115/45341
Relation
  • isIdenticalTo DOI https://doi.org/10.1063/1.1804238
Journal
    • PISSN 0003-6951
    • EISSN 1077-3118
      • en Applied Physics Letters
      • Volume Number85 Issue Number15 Page Start3268 Page End3270
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Oaidate 2023-07-26