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Title
  • Probing subpicosecond dynamics using pulsed laser combined scanning tunneling microscopy
Creator

Takeuchi, Osamu

Aoyama, Masahiro

Oshima, Ryuji

Okada, Yoshitaka

Oigawa, Haruhiro

Sano, Nobuyuki

Shigekawa, Hidemi

Morita, Ryuji

NRID 1000030222350

Yamashita, Mikio

NRID 1000010240631
Rights
    • Copyright 2004 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Appl. Phys. Lett. 85, 3268 (2004) and may be found at https://dx.doi.org/10.1063/1.1804238
Subject
  • NDC 549
Description
Other
  • Time-resolved tunneling current measurement in the subpicosecond range was realized by ultrashort-pulse laser combined scanning tunneling microscopy, using the shaken-pulse-pair method. A low-temperature-grown GaN_[x]As_[1-x] (x=0.36%) sample exhibited two ultrafast transient processes in the time-resolved tunnel current signal, whose lifetimes were determined to be 0.653±0.025 and 55.1±5.0 ps. These values are of the same order of magnitude as those measured in the conventional pump-probe reflectivity measurement.
PublisherAmerican Institute of Physics
Date Issued 2004-10-11
Languageeng
NIItypejournal article
VersiontypeVoR
Identifier URI http://hdl.handle.net/2115/45341
Relation
  • isIdenticalTo DOI https://doi.org/10.1063/1.1804238
Journal
    • ISSN 0003-6951
    • ISSN 1077-3118
    • Applied Physics Letters
    85(15), 3268-3270
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Oaidate2019-05-29T08:10:42Z